Testing the resistance to mechanical fatigue of electronic circuits used in chip cards or electronic labels, manufactured from a continuous strip, by putting a continuous strip through mechanical aging and then electronic testing

摘要

Method has the following steps: formation of a closed loop (B) with a strip section, winding the loop around a number of rollers (1-4), submission of the loop to a fatigue cycle by its execution of a predetermined number of turns at a predetermined speed around the rollers and finally testing the electronic circuits on the loop. The invention also relates to a device for executing testing of the electronic circuits on the strip.