首页> 外国专利> METHOD FOR MEASURING AND COMPENSATING FOR THE DEFORMATION OF THE RADIANT SURFACE OF AN ANTENNA AND ANTENNA COMPRISING MEANS EMPLOYING SUCH A METHOD

METHOD FOR MEASURING AND COMPENSATING FOR THE DEFORMATION OF THE RADIANT SURFACE OF AN ANTENNA AND ANTENNA COMPRISING MEANS EMPLOYING SUCH A METHOD

机译:一种测量和补偿天线辐射面变形的方法及采用这种方法的包含天线的方法

摘要

The present invention relates to a method for determining the error of the radiation pattern of an electronic scanning antenna, the error being due to the mechanical deformation of the radiating surface of the antenna, and the determination, in view of the correction of this error, being carried out from measurements of the mechanical deformation of the radiating surface. The method compensates for the deformation measured by calculating and applying a phase difference correction to the phase shifters. The present invention also relates to an antenna comprising means implementing such a method. The mechanical deformation is estimated by optical measurements. of measurement points is less than the number of radiating elements of the antenna. Correction of the error is carried out during the operation of the antenna. The invention applies in particular to antennas with electronic scanning at cost and mass reduced. / P
机译:本发明涉及一种用于确定电子扫描天线的辐射方向图的误差的方法,该误差是由于天线的辐射面的机械变形引起的,并且鉴于该误差的确定,通过测量辐射表面的机械变形来进行。该方法通过计算相位差校正并将其应用于移相器来补偿所测量的变形。本发明还涉及一种天线,该天线包括实施这种方法的装置。通过光学测量来估计机械变形。测量点的数量少于天线的辐射元件的数量。误差的校正是在天线工作期间进行的。本发明尤其适用于具有成本和质量降低的电子扫描的天线。

著录项

  • 公开/公告号FR2818812A1

    专利类型

  • 公开/公告日2002-06-28

    原文格式PDF

  • 申请/专利权人 THOMSON CSF;

    申请/专利号FR20000016774

  • 申请日2000-12-21

  • 分类号H01Q21/00;H01Q3/26;

  • 国家 FR

  • 入库时间 2022-08-22 00:24:14

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