首页> 外国专利> Multicharged ion beam sweeping using repeated sweeping over a single zone of a substrate with a displacement of the beam after each passage to cover the whole surface of the substrate

Multicharged ion beam sweeping using repeated sweeping over a single zone of a substrate with a displacement of the beam after each passage to cover the whole surface of the substrate

机译:多电荷离子束扫掠,是在每次通过以覆盖衬底整个表面之后的离子束位移的情况下,在衬底的单个区域上重复扫掠

摘要

A method for sweeping with multicharged ions forming a beam of given diameter, the sweeping being effected following two axes of a plane of a substrate to be irradiated, consists of effecting a repeated sweeping on a single zone. This repeated sweeping is made up of a number of elementary sweepings each corresponding to two successive passages of the beam and forming a to and fro movement, applying the repeated sweeping with a repetition frequency determined as a function of the predefined number of irradiation passages on the single zone and as a function of the pre-established treatment time for the substrate and realising a displacement of the beam with each passage at an amplitude equal to a fraction of the diameter of the beam in direct relation with this frequency in order to irradiate the whole surface of the substrate. An independent claim is also included for a system of sweeping with multicharged ions generated by a source for putting this method into service.
机译:一种用多电荷离子扫掠形成给定直径的射束的方法,该扫掠是沿着要辐照的衬底平面的两个轴进行的,该方法包括在单个区域上进行重复扫掠。该重复扫描由多个基本扫描组成,每个基本扫描对应于光束的两个连续通道,并形成往复运动,并将重复频率确定为重复频率,该重复频率根据预定义的照射通道数量而确定。单个区域并根据预先确定的基板处理时间来实现,每次照射时光束的位移幅度等于光束直径的一部分,与该频率成正比,以便照射该光束基材的整个表面。还包括针对由源产生的多电荷离子进行扫掠的系统的独立权利要求,以将该方法投入使用。

著录项

  • 公开/公告号FR2820151A1

    专利类型

  • 公开/公告日2002-08-02

    原文格式PDF

  • 申请/专利权人 X-ION;

    申请/专利号FR20010001227

  • 发明设计人 GILLES BORSONI;JEAN PIERRE LAZZARI;

    申请日2001-01-30

  • 分类号C23C14/22;C23C14/08;C30B29/16;C30B30/02;C30B30/04;

  • 国家 FR

  • 入库时间 2022-08-22 00:24:12

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