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Use the X diffraction qualitative analysis manner and the qualitative analysis device

机译:使用X衍射定性分析方式和定性分析装置

摘要

PURPOSE:To automatically conduct a qualitative analysis sing an X-ray diffraction while maintaining an analyzed result with high reliability. CONSTITUTION:An X-ray analysis profile is obtained for an unknown sample (102). The kind of an element included in the sample is obtained by the element analytic measurement, and all internal substances to be considered from the X-ray diffraction profile are selected by referring to standard peak card data (104). The combination of all the selected substances is taken, and a plurality of sets of the substance combinations are predicted (106). The substance combination which does not include all the elements obtained as above of the predicted combinations of all the substances is deleted from the data, the standard peak card data corresponding to the combination of the residual substances without deletion is compared with the profile in terms of the degree of conformance, and suitable internal substance combination is selected.
机译:目的:使用X射线衍射自动进行定性分析,同时保持分析结果的高度可靠性。组成:获得了未知样品的X射线分析曲线(102)。通过元素分析测量获得样品中包括的元素的种类,并且通过参考标准峰卡数据来选择要从X射线衍射曲线中考虑的所有内部物质(104)。获取所有选择的物质的组合,并且预测多组物质组合(106)。从数据中删除不包括从上述所有物质的预测组合中获得的所有元素的物质组合,将与未删除的残留物质组合相对应的标准峰卡数据与曲线进行比较,以符合程度,并选择合适的内部物质组合。

著录项

  • 公开/公告号JP3452278B2

    专利类型

  • 公开/公告日2003-09-29

    原文格式PDF

  • 申请/专利权人 理学電機株式会社;

    申请/专利号JP19940171684

  • 发明设计人 山田 義行;難波 徹;土性 明秀;

    申请日1994-06-30

  • 分类号G01N23/207;

  • 国家 JP

  • 入库时间 2022-08-22 00:22:15

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