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LOC die ri - dohure - mu

机译:lo C叠日 - 的哦胡热 - 木

摘要

PROBLEM TO BE SOLVED: To prevent destruction phenomenon in a manufacturing process and improve anti-corrosion and characteristic against stress corrosion cracking, by forming an LOC-type lead frame of copper alloy of IACS having conductivity in a specified range. ;SOLUTION: An LOC-type lead frame 11, wherein a lead 12 extends on an element 10, is formed of copper alloy of IACS of 5-25%. The copper alloy contains Zn as first alloy component and one element selected out of a group of Sn, Si, Ni as second alloy component. As a result, a thermal expansion coefficient approximates that of the element 10 and a sealing resin 16, and an LOC package wherein destruction phenomenon is hardly generated and high in reliability is obtained. By covering Pd and Ru, reliability is more improved. Material cost is reduced more than in a conventional case, and mounting efficiency required by enlargement of an element which is to be caused by high level integration of a semiconductor device can be improved.;COPYRIGHT: (C)1998,JPO
机译:要解决的问题:通过形成具有规定范围内导电性的IACS的铜合金的LOC型引线框,防止制造过程中的破坏现象并提高抗腐蚀性能和抗应力腐蚀开裂的特性。解决方案:LOC型引线框架11由5-25%的IACS铜合金形成,其中引线12在元件10上延伸。铜合金包含Zn作为第一合金成分和选自Sn,Si,Ni的组中的一种元素作为第二合金成分。结果,热膨胀系数接近元件10和密封树脂16的热膨胀系数,并且LOC封装几乎不产生破坏现象并且获得了高可靠性。通过覆盖Pd和Ru,可进一步提高可靠性。与传统情况相比,材料成本降低得更多,并且可以提高由于半导体器件的高水平集成而导致的元件扩大所需要的安装效率。;版权所有:(C)1998,JPO

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