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Ultrasonic flaw detection method jig flaw defect criteria and using the jig flaw detection criteria defect

机译:超声波探伤方法夹具缺陷探伤标准及使用夹具缺陷探伤标准的缺陷

摘要

PURPOSE: To simply and accurately detect the reflection echo from e reference hole of ϕ4×4 of a standard testpiece STB-A3. ;CONSTITUTION: A jig 1 has a guide 11 formed at the outer end face in the same shape ass the end face of a standard testpiece STB-A3 and extended obliquely to the longitudinal direction of the jig 1 and a scale indicating the horizontal distance from a reference defect and attached along the guide 11. The jig 1 is mounted on the upper or lower surface of the STB-A3 and so aligned that the end face of the STB-AC and the outer end face of the jig 1 become substantially in plane. The probe 2 of an ultrasonic flaw detector is brought into contact with the guide 11, moved to the scale position responsive to the refractive angle of the probe 2 with the scale as a measure, and an ultrasonic wave is transmitted. As long as the probe 2 is brought into contact with the guide 11, the wave from the probe 2 is emitted to the center of the reference defect, and hence the reflection echo from the reference defect can be effectively detected.;COPYRIGHT: (C)1996,JPO
机译:用途:为了简单,准确地检测到来自标准测试件STB-A3的φ4×4的参考孔的反射回波。 ;组成:夹具1在其外端面上以与标准测试件STB-A3的端面相同的形状并沿夹具1的长度方向倾斜延伸的方式形成有导向装置11,刻度尺指示从基准缺陷并沿着引导件11附接。夹具1安装在STB-A3的上表面或下表面上,并且对准成使得STB-AC的端面和夹具1的外端面基本上成一条直线。飞机。使超声波探伤仪的探针2与引导件11接触,以标尺作为尺度,响应于探针2的折射角而移动到标尺位置,并发送超声波。只要探针2与导向器11接触,来自探针2的波就会发射到参考缺陷的中心,因此可以有效地检测到来自参考缺陷的反射回波。 1996年,日本特许厅

著录项

  • 公开/公告号JP3442899B2

    专利类型

  • 公开/公告日2003-09-02

    原文格式PDF

  • 申请/专利权人 日立建機株式会社;

    申请/专利号JP19950079126

  • 发明设计人 畑田 健;

    申请日1995-04-04

  • 分类号G01N29/22;G01N29/04;

  • 国家 JP

  • 入库时间 2022-08-22 00:21:52

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