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FUNCTION FACULTY RECONSTITUTABLE INTEGRATED CIRCUIT AND FUNCTION FACULTY RECONSTITUTING METHOD

机译:功能故障可重构的集成电路和功能故障的重构方法

摘要

PROBLEM TO BE SOLVED: To provide a function faculty reconstitutable integrated circuit and a function faculty reconstituting method which can constitute the function faculty reconstitutable integrated circuit by an integrated circuit which can reconstitute a logical function faculty with a small number of element circuits.;SOLUTION: The function faculty reconstitutable integrated circuit is characterized in that a threshold element circuit having a plurality of stages of threshold elements coupled has a structure which can select one of a plurality of thresholds and the selected one threshold is a signal in multi-valued representation.;COPYRIGHT: (C)2003,JPO
机译:解决的问题:提供一种功能学可重构集成电路和一种功能学可重构方法,该方法可通过一种集成电路来构成功能学可重构集成电路,该集成电路可以用少量的元件电路来重构逻辑功能学。该功能师可重构集成电路的特征在于,具有多级耦合的阈值元件的阈值元件电路具有可以选择多个阈值之一的结构,并且所选择的一个阈值是多值表示的信号。版权:(C)2003,日本特许厅

著录项

  • 公开/公告号JP2003258098A

    专利类型

  • 公开/公告日2003-09-12

    原文格式PDF

  • 申请/专利权人 NIPPON TELEGR & TELEPH CORP NTT;

    申请/专利号JP20020052439

  • 发明设计人 AOYAMA KAZUO;

    申请日2002-02-27

  • 分类号H01L21/82;H01L21/822;H01L27/04;H03K19/20;

  • 国家 JP

  • 入库时间 2022-08-22 00:21:37

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