首页> 外国专利> Minute opening survey instrument and minute opening inspection manner

Minute opening survey instrument and minute opening inspection manner

机译:分钟开度调查仪器和分钟开度检查方式

摘要

PROBLEM TO BE SOLVED: To provide a method and an equipment for inspecting a microcgap stably and accurately at high speed through an inexpensive constitution. ;SOLUTION: The microgap inspection equipment comprises means 100 for picking up the image of an optical interference fringe appearing in a ring-like microgap, a first matrix developing means 103 for developing the image data on a coordinate determined by the angle from an arbitrary line extending radially from the center of the ring and the distance from time center of the ring onto a first matrix having rows and columns corresponding, respectively, to the angle and the distance, a second matrix generating means 104 for generating a second matrix having columns of the difference between the adjacent columns in the first matrix, and means 105 for calculating the standard deviation based on each element in the second matrix and making a decision whether a foreign matter is present in the microgap based on the difference between the maximum and minimum values of standard deviation of each column.;COPYRIGHT: (C)1998,JPO
机译:解决的问题:提供一种通过廉价的构造来高速且稳定且准确地检查微间隙的方法和设备。 ;解决方案:微间隙检查设备包括:装置100,用于拾取出现在环状微间隙中的光学干涉条纹的图像;第一矩阵显影装置103,用于在由任意线的角度确定的坐标上显影图像数据第二矩阵生成装置104从环的中心沿径向延伸,并且从环的时间中心沿距离延伸到具有分别对应于该角度和距离的行和列的第一矩阵上,该第二矩阵生成装置104用于生成具有以下列的第二矩阵:第一矩阵中相邻列之间的差,以及用于基于第二矩阵中的每个元素计算标准偏差并基于最大值和最小值之间的差来确定微间隙中是否存在异物的装置105每一列的标准偏差。.版权所有:(C)1998,JPO

著录项

  • 公开/公告号JP3418958B2

    专利类型

  • 公开/公告日2003-06-23

    原文格式PDF

  • 申请/专利权人 オムロン株式会社;

    申请/专利号JP19970157923

  • 发明设计人 大西 徹也;長坂 昭吾;岡安 裕;

    申请日1997-05-30

  • 分类号G01N21/88;G01B11/14;

  • 国家 JP

  • 入库时间 2022-08-22 00:21:20

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号