首页> 外国专利> FAULT OCCURRENCE CAUSE ANALYTICAL DEVICE, FAULT OCCURRENCE CAUSE ANALYTICAL METHOD, AND FAULT OCCURRENCE CAUSE ANALYTICAL PROGRAM

FAULT OCCURRENCE CAUSE ANALYTICAL DEVICE, FAULT OCCURRENCE CAUSE ANALYTICAL METHOD, AND FAULT OCCURRENCE CAUSE ANALYTICAL PROGRAM

机译:故障发生原因分析设备,故障发生原因分析方法和故障发生原因分析程序

摘要

PPROBLEM TO BE SOLVED: To provide a fault occurrence cause analytical device, an analytical method and an analytical program capable of analyzing efficiently the fault occurrence cause. PSOLUTION: A processing device 11 has an access log recording part 11a for recording the content of an SQL sentence transmitted to a database management system program in an access log file 14 together with transmission source client information at the start time and the normal finish time of processing by the transmitted SQL sentence, an access log retrieval processing part 11b for retrieving and acquiring a log record having a strong possibility of a fault occurrence cause from the access log file 14, and a fault log record recording part 11c for recording the retrieved log record in a fault log record file 15. PCOPYRIGHT: (C)2003,JPO
机译:

要解决的问题:提供一种能够有效地分析故障发生原因的故障发生原因分析装置,分析方法和分析程序。解决方案:处理设备11具有访问日志记录部分11a,用于在开始时间和正常时间将访问数据库文件的SQL语句的内容与发送源客户信息一起记录在访问日志文件14中。通过发送的SQL语句进行的处理的结束时间,用于从访问日志文件14中检索并获取极有可能发生故障的原因的日志记录的访问日志检索处理部11b,以及用于记录的故障日志记录记录部11c故障日志记录文件15中检索到的日志记录。

COPYRIGHT:(C)2003,JPO

著录项

  • 公开/公告号JP2003263353A

    专利类型

  • 公开/公告日2003-09-19

    原文格式PDF

  • 申请/专利权人 HITACHI INFORMATION SYSTEMS LTD;

    申请/专利号JP20020064167

  • 发明设计人 YOSHIDA KENJI;

    申请日2002-03-08

  • 分类号G06F12/00;G06F11/34;

  • 国家 JP

  • 入库时间 2022-08-22 00:20:37

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