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SYSTEM FOR ANALYZING QUALITY DEFECT IN MANUFACTURING PROCESS

机译:制造过程质量缺陷分析系统

摘要

PROBLEM TO BE SOLVED: To provide a system for analyzing quality defect in a manufacturing process, that can compare a defective portion in a selling store with a checked result portion in a factory by a development to calculate a correlation ratio, and quickly specify the cause of the failure in a manufacturing process based on judgment from the correlation ratio. ;SOLUTION: A product defective site 85 is displayed at a development 84 based on coordinate data extracted from quality associated data being data related with any defective portion in a selling store by development contrast display software 34 of a quality failure analyzing CPU 30, and a checked result portion 86 is displayed at the same development 84 based on the coordinate data extracted from checked result data being data related with the portion associated with the check in the factory. Also, a correlation ratio 88 is calculated by using the coordinate data, and the factor of the cause of the failure is extracted based on the correlation ratio, and the cause of the failure is surveyed from the extracted factor by failure cause surveying software 39.;COPYRIGHT: (C)2003,JPO
机译:要解决的问题:提供一种用于分析制造过程中质量缺陷的系统,该系统可以通过开发将卖场中的缺陷部分与工厂中的检查结果部分进行比较,以计算相关比率,并快速确定原因基于相关比的判断来确定制造过程中的故障。 ;解决方案:基于质量相关性分析CPU 30的显影对比显示软件34,从质量相关数据中提取的坐标数据是从质量关联数据中提取的坐标数据,该质量相关数据是与销售商店中的任何缺陷部分有关的数据,产品缺陷部位85被显示在开发84中。基于从检查结果数据中提取的坐标数据将检查结果部分86显示在相同的展开84处,该检查结果数据是与工厂中与检查相关的部分有关的数据。另外,通过使用坐标数据来计算相关比率88,并且基于相关比率来提取故障原因的因素,并且故障原因调查软件39从提取的因素中调查故障原因。 ;版权:(C)2003,日本特许厅

著录项

  • 公开/公告号JP2002358121A

    专利类型

  • 公开/公告日2002-12-13

    原文格式PDF

  • 申请/专利权人 HONDA MOTOR CO LTD;

    申请/专利号JP20010167117

  • 申请日2001-06-01

  • 分类号G05B23/02;G06F17/60;

  • 国家 JP

  • 入库时间 2022-08-22 00:16:43

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