首页> 外国专利> OPTICAL SPECTRUM ANALYZER AND METHOD OF MEASURING OPTICAL SPECTRUM

OPTICAL SPECTRUM ANALYZER AND METHOD OF MEASURING OPTICAL SPECTRUM

机译:光学光谱分析仪和光学光谱的测量方法

摘要

PROBLEM TO BE SOLVED: To provide an optical spectrum analyzer free of absorption by a specific wavelength due to an OH group and capable of precisely measuring the level of specific wavelengths of light to be measured.;SOLUTION: The optical spectrum analyzer 1 spectrally separates incident light to be measured into light having specific wavelengths, measures the light intensity of the light spectrally separated, and measures optical spectrum of the light to be measured. The analyzer comprises a diffraction grating 8 for separating the incident light to be measured L into specific wavelengths and outputting them as component light, a light receiving unit 2 for measuring the light intensity of each component light, a vessel 13 in which the diffraction grating 8 and the light receiving unit 2 are placed, and a gas inlet 12 and a gas outlet 14 for replacing the air inside the vessel 13 with a predetermined gas.;COPYRIGHT: (C)2003,JPO
机译:要解决的问题:提供一种光谱分析仪,该光谱分析仪不会由于OH基团而受到特定波长的吸收,并且能够精确地测量要测量的特定波长的光的水平。解决方案:光谱分析仪1对入射光进行光谱分离将被测量的光转换为具有特定波长的光,测量被光谱分离的光的光强度,并测量被测量的光的光谱。该分析仪包括:衍射光栅8,用于将入射的被测光L分离成特定的波长,并将其作为成分光输出;光接收单元2,用于测量每种成分光的光强度;容器13,其中衍射光栅8放置光接收单元2,并用进气口12和出气口14用预定的气体代替容器13内的空气。版权所有:(C)2003,JPO

著录项

  • 公开/公告号JP2003161654A

    专利类型

  • 公开/公告日2003-06-06

    原文格式PDF

  • 申请/专利权人 ANDO ELECTRIC CO LTD;

    申请/专利号JP20010360000

  • 申请日2001-11-26

  • 分类号G01J3/18;G01J3/42;

  • 国家 JP

  • 入库时间 2022-08-22 00:13:33

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号