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Emission control for perfluorocompound gases by microwave plasma torch

机译:微波等离子体炬控制全氟化合物气体的排放

摘要

The surface cleaning of various components of high-tech devices, including computers and/or semiconductors, is performed during manufacturing. This surface cleaning is performed within a reduced pressure chamber by making use of perifluorocompound industrial gases, which eventually contaminate the atmosphere. These contaminant gases are emitted with nitrogen gas, which is used in operation of a dry pump. Under certain conditions, microwave radiation generates an atmospheric plasma torch. This plasma-torch device is attached to the vacuum pump, which emits the nitrogen gas with contaminants. The oxidation mechanism in the torch flames eliminates these contaminants. Additional reaction gases are mixed with the waste gas to improve efficiency of the contaminant elimination.
机译:在制造过程中,对高科技设备的各种组件(包括计算机和/或半导体)进行表面清洁。这种表面清洁是通过使用全氟化合物工业气体在减压室内进行的,该工业气体最终会污染大气。这些污染物气体与氮气一起排放,氮气用于干泵的运行。在某些条件下,微波辐射会产生大气等离子炬。该等离子炬装置安装在真空泵上,该真空泵发射出带有污染物的氮气。火炬火焰中的氧化机制消除了这些污染物。将其他反应气体与废气混合,以提高污染物去除效率。

著录项

  • 公开/公告号US6620394B2

    专利类型

  • 公开/公告日2003-09-16

    原文格式PDF

  • 申请/专利权人 UHM HAN SUP;

    申请/专利号US20010880885

  • 发明设计人 HAN SUP UHM;HO-JUN KANG;YONG C. HONG;

    申请日2001-06-15

  • 分类号A62D30/00;

  • 国家 US

  • 入库时间 2022-08-22 00:07:09

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