Evaluation device of weighted fault coverage and evaluation method of the same

摘要

The present invention provides evaluation device and evaluation method of weighted fault coverage useful for creation of test patterns of high fault coverage corresponding to manufacturing quality of LSI at high precision. In the evaluation device and evaluation method of fault coverage of the present invention, in a large scale integration such as system LSI, in order to utilize the results of fault simulation or ATPG in improvement of quality in the manufacturing field, the faults assumed in logic connection nodes and input and output terminals of the internal basic cell are weighted in relation to various data relating to fault occurrence extracted from the actual layout data, and the weighted fault coverage is calculated from the result of fault simulation or ATPG by using them. Accordingly, at an early stage of a manufacturing process, the fault coverage for faults of high occurrence is obtained with high precision, and by adding the test patterns so as to enhance the weighted fault coverage, the manufacturing quality of LSI can be enhanced efficiently.