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Data processing method and apparatus to determine killer ratio based on a variety of defect types

机译:基于多种缺陷类型确定杀手率的数据处理方法和装置

摘要

When a killer ratio resulting from a specified defect is calculated from die research data including the number of defects and manufacturing result pass/fail for each of a plurality of dies, the die research data is classified based on the number of the specified defects present on a die to calculate a killer ratio for each of a plurality of the classified groups, from which a killer ratio in the case of one specified defect is calculated for each of the groups. The killer ratio for each of the groups is weighted in accordance with the number of the specified defects to calculate one killer ratio as the average value of the weighted killer ratios, thereby calculating one killer ratio which reflects the effect of the number of the specified defects present on a die.
机译:当从包括缺陷数量和多个模具中的每个模具的制造结果合格/不合格的模具研究数据中计算出由特定缺陷导致的杀手率时,基于存在于模具上的特定缺陷的数量对模具研究数据进行分类。用于为多个分类组中的每一个计算杀伤率的模具,由此为每个组计算在一个指定缺陷的情况下的杀伤率。根据指定缺陷的数量对每个组的杀手率进行加权,以计算一个杀手率作为加权杀手率的平均值,从而计算出一个反映指定缺陷数影响的杀手率。现在死了。

著录项

  • 公开/公告号US6496788B1

    专利类型

  • 公开/公告日2002-12-17

    原文格式PDF

  • 申请/专利权人 NEC CORPORATION;

    申请/专利号US20000544284

  • 发明设计人 HIROAKI KIKUCHI;

    申请日2000-04-06

  • 分类号G06F171/80;H01L216/60;

  • 国家 US

  • 入库时间 2022-08-22 00:06:14

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