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Calibration system and method for phased array antenna using near-field probe and focused null

机译:使用近场探头和聚焦零点的相控阵天线校准系统和方法

摘要

A system and method for calibrating a phase array antenna using a near-field probe and focused null and a signal coherent with the beam received or transmitted at the null location of the probe. In the transmit mode, a base-band phase comparator circuit is established by locating the first probe at the angular location of the null and the first probe measures the field at the null while an offset phase reference probe, or second probe, measures the field at one of the sum peaks of the difference lobes as the reference. In the transmit mode, the method uses the pattern characteristics of the difference pattern to allow direct measurement of the phase reference by the second probe that is located at one of the sum peaks of the difference pattern. In the receive mode, the signal source provides the reference and the second probe is not necessary.
机译:一种用于使用近场探针和聚焦的零点以及与在探针的零点位置处接收或发射的波束相干的信号来校准相控阵天线的系统和方法。在发射模式下,通过将第一探头放置在零点的角度位置来建立基带相位比较器电路,并且第一探头在零点处测量场,而偏移相位参考探头或第二探头测量该场在差瓣的和峰之一处作为参考。在发射模式下,该方法使用差异图案的图案特性,以允许位于差异图案之和峰值之一处的第二探针直接测量相位参考。在接收模式下,信号源提供参考,并且不需要第二个探头。

著录项

  • 公开/公告号US6636173B2

    专利类型

  • 公开/公告日2003-10-21

    原文格式PDF

  • 申请/专利权人 LOCKHEED MARTIN CORPORATION;

    申请/专利号US20010027393

  • 发明设计人 WILLIAM JOHN GRAHAM;

    申请日2001-12-20

  • 分类号G01S74/00;

  • 国家 US

  • 入库时间 2022-08-22 00:06:01

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