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Timing calibration and timing calibration verification of electronic circuit testers

机译:电子电路测试仪的时序校准和时序校准验证

摘要

Systems and methods for calibrating the timing of electronic circuit testers and verifying the timing calibration of electronic circuit testers are described. In some embodiments, a calibration reference signal is transmitted from the test head directly through the load board interface, rather than through external instruments, so that timing errors associated with external wires and cables may be avoided. The timing calibration and timing calibration verification functionality is provided on a single calibration board, thereby reducing the calibration set-up time relative to conventional robot-based calibrators. In addition, a high pin count electronic circuit testers may be calibrated by a calibration board that is configured to calibrate one subset of the test channels at a time. In some embodiments, test channels are connected directly to calibration board comparators to avoid the accumulated signal degradation and the signal path route errors that may result from transmitting tester channel signals through a mechanical relay selection matrix.
机译:描述了用于校准电子电路测试器的时序并验证电子电路测试器的时序校准的系统和方法。在一些实施例中,校准参考信号直接从测试头通过负载板接口而不是通过外部仪器传输,从而可以避免与外部电线和电缆相关的定时误差。时序校准和时序校准验证功能在单个校准板上提供,从而相对于传统的基于机器人的校准器减少了校准设置时间。另外,高引脚数电子电路测试仪可以由校准板校准,该校准板被配置为一次校准一个测试通道的子集。在一些实施例中,测试通道直接连接到校准板比较器,以避免累积的信号降级和可能由于通过机械继电器选择矩阵传输测试器通道信号而导致的信号路径路由错误。

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