首页> 外国专利> SCANNING EXPOSURE IN WHICH AN OBJECT AND PULSED LIGHT ARE MOVED RELATIVELY, EXPOSING A SUBSTRATE BY PROJECTING A PATTERN ON A MASK ONTO THE SUBSTRATE WITH PULSED LIGHT FROM A LIGHT SOURCE, LIGHT SOURCES THEREFOR, AND METHODS OF MANUFACTURING

SCANNING EXPOSURE IN WHICH AN OBJECT AND PULSED LIGHT ARE MOVED RELATIVELY, EXPOSING A SUBSTRATE BY PROJECTING A PATTERN ON A MASK ONTO THE SUBSTRATE WITH PULSED LIGHT FROM A LIGHT SOURCE, LIGHT SOURCES THEREFOR, AND METHODS OF MANUFACTURING

机译:相对移动物体和脉冲光的扫描曝光,通过将来自光源,光源及其制造方法的脉冲光投射到基质上,将图案投射到基质上,从而将基质暴露于基质中

摘要

In a scanning exposure apparatus and method, a pattern formed on a mask is transferred onto a substrate by scanning the mask and the substrate synchronously with respect to pulsed light emitted from a pulsed laser light source. A number of pulses of a light beam that are to be emitted to each point on the substrate during scanning exposure is determined, and the light source is controlled according to the determined number of pulses, so that the maximum scanning speeds of the mask and the substrate and/or the maximum oscillation period of the pulsed light are maintained during the scanning exposure process. In another arrangement, during the process of exposing a shot area on the substrate, integral values of the amount of exposure energy are detected at a plurality of points in that shot area. Based on this detection result, the oscillation frequency of the pulsed light that is to be emitted to the next shot area is determined so that the next shot area is exposed at an appropriate exposure level. In another arrangement, the light source and/or the exposure light emitted from the light source are adjusted so that the output level of the light source is set to the minimum required level, and so that the target value of the integral exposure dose is reliably achieved without reducing the scanning speeds of the mask and the substrate from their maximum. In still another arrangement, during the process for exposing the substrate to the laser beam, while scanning the substrate to transfer the mask pattern, the illuminance of the light source is controlled at a constant value. In yet another arrangement, when the exposure apparatus is not performing exposure (i.e., during the non-exposure period of the operation), the illuminance of the light source is maintained at a constant level, but the exposure light is blocked by a blind so as not to reach the mask or the mask stage.
机译:在扫描曝光设备和方法中,通过相对于从脉冲激光源发射的脉冲光同步扫描掩模和基板,在掩模上形成的图案被转印到基板上。确定在扫描曝光期间要发射到基板上每个点的光束的脉冲数,并根据确定的脉冲数来控制光源,以使掩模和扫描仪的最大扫描速度在扫描曝光过程中,保持基板和/或脉冲光的最大振荡周期。在另一种布置中,在将曝光区域曝光在基板上的过程中,在该曝光区域中的多个点处检测曝光能量的积分值。基于该检测结果,确定要发射到下一个照射区域的脉冲光的振荡频率,以使下一个照射区域以适当的曝光水平曝光。在另一种布置中,调节光源和/或从光源发射的曝光光,使得光源的输出水平被设置为最小所需水平,并且使得积分曝光剂量的目标值可靠。在不降低掩模和基板的最大扫描速度的情况下实现了这一目的。在又一布置中,在用于将基板暴露于激光束的过程中,在扫描基板以转印掩模图案的同时,将光源的照度控制为恒定值。在又一布置中,当曝光设备不执行曝光时(即,在操作的非曝光时段期间),光源的照度被保持在恒定水平,但是曝光光被百叶窗阻挡,因此以免到达面具或面具舞台。

著录项

  • 公开/公告号US6538723B2

    专利类型

  • 公开/公告日2003-03-25

    原文格式PDF

  • 申请/专利权人 NIKON CORPORATION;

    申请/专利号US19990351173

  • 发明设计人 SHIGERU HAGIWARA;KEN OZAWA;

    申请日1999-07-12

  • 分类号G03B275/40;G03B277/40;G03B274/20;

  • 国家 US

  • 入库时间 2022-08-22 00:05:31

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