首页> 外国专利> Electron scatter in a thin membrane to eliminate detector saturation

Electron scatter in a thin membrane to eliminate detector saturation

机译:电子散射在薄膜中以消除检测器饱和

摘要

An electron beam system employs a non-saturating detector for measuring total beam current that comprises a thin membrane of only a few microns thickness placed before a detector and separated from the detector by a drift space of about 10 mm, so that electrons in the beam are not absorbed to any significant extent, but are scattered transversely to spread the beam and avoid local saturation of the detector.
机译:电子束系统采用非饱和检测器来测量总电子束电流,该电子束系统包括仅几微米厚的薄膜,该薄膜放置在检测器之前,并与检测器隔开约10 mm的漂移空间,以便电子束中的电子不会明显吸收,而是横向散射以扩散光束并避免检测器局部饱和。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号