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Passive, temperature compensated techniques for tunable filter calibration in bragg-grating interrogation systems

机译:无源温度补偿技术,用于布拉格光栅询问系统中的可调滤波器校准

摘要

A passive, temperature compensated tunable filter calibration device for a Bragg grating interrogation system. In a first system, a dual-substrate Bragg grating calibration system, the temperature of an array of gratings is estimated using an array of gratings bonded to a common host substrate and a single grating bonded to a material with a different coefficient of thermal expansion. Changes in a common temperature of the substrates is measured by monitoring the difference between shifts of grating wavelength. As a filter voltage is scanned from its lowest to its highest voltage, the voltages are recorded. The second lowest wavelength corresponds to the grating attached to the differing substrate. The voltages are used to calculate a voltage-to-wavelength function for the scanning range of the filter. To compensate for variations in a calibration curve and temperature variations of the calibration array, the temperature is estimated and function re-calculated at every pass of the scanning filter. In a second system, a hydrogen-cyanide wavelength reference absorption cell that absorbs light at discrete wavelengths corresponding to the molecular vibrational mode frequencies of the gas. With a broadband optical light input to the cell, the output displays the spectrum of the input with several narrow dips in the spectra corresponding to the absorption lines of the cell. A first photodetector sees the transmission spectrum and a second sees the reflections from Bragg gratings in a sensing array. The filter drive voltages that coincide with the dips of the transmission spectrum are used to calibrate the voltage-to-wavelength function of the scanning filter. In this system there is no temperature compensation step as the absorption lines are not sensitive to temperature.
机译:用于布拉格光栅询问系统的无源,温度补偿的可调滤波器校准装置。在第一系统,即双基板布拉格光栅校准系统中,使用结合到共同主基板上的光栅阵列和结合到具有不同热膨胀系数的材料上的单个光栅来估计光栅阵列的温度。通过监视光栅波长的偏移之间的差来测量基板的共同温度的变化。从最低电压到最高电压扫描滤波器电压时,会记录电压。第二最低波长对应于附接到不同基板的光栅。电压用于计算滤波器扫描范围的电压至波长函数。为了补偿校准曲线的变化和校准阵列的温度变化,在扫描过滤器的每一次通过时都要估算温度并重新计算功能。在第二个系统中,是氰化氢波长参考吸收池,它吸收与气体的分子振动模式频率相对应的离散波长的光。当宽带光输入到该单元时,输出显示输入的光谱,该光谱在对应于该单元吸收线的光谱中有几个窄的倾角。第一个光电探测器看到透射光谱,第二个光电探测器看到感应阵列中布拉格光栅的反射。与透射光谱的谷值一致的滤波器驱动电压用于校准扫描滤波器的电压-波长函数。在该系统中,没有温度补偿步骤,因为吸收线对温度不敏感。

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