Optical system for measuring two-dimensional small scattering angle of X-ray radiation of high flow and low interfering background

摘要

An x-ray analysis system including a focusing optic for focusing an x-ray beam to a focal point, a first slit optically coupled to the focusing optic, a second slit optically coupled to the first slit, and an x-ray detector, where the focal point is located in front of the detector.