首页> 外国专利> Optical measurement system for detection of defects in surface comprises lighting system with light source and optical system, which can apply thin shafts of light with well-defined distance between shafts

Optical measurement system for detection of defects in surface comprises lighting system with light source and optical system, which can apply thin shafts of light with well-defined distance between shafts

机译:用于检测表面缺陷的光学测量系统包括带光源的照明系统和光学系统,它们可以施加细轴的光,且轴之间的距离明确

摘要

The optical measurement system is for the detection of defects in a surface and comprises a lighting system with a light source and an optical system, which can apply thin shafts of light with well-defined distance between shafts. A camera and key algorithms are used to calculate both the low frequency variation of a surface and that of high frequency. - Triangulation is used to determine the distance that each measured point has from a base surface or from the camera used.
机译:光学测量系统用于检测表面中的缺陷,并且包括具有光源和光学系统的照明系统,该光学系统可以施加细轴的光,且轴之间的距离明确。使用相机和关键算法来计算表面的低频变化和高频的变化。 -三角测量用于确定每个测量点到底面或所用摄像机的距离。

著录项

  • 公开/公告号DK200200080A

    专利类型

  • 公开/公告日2003-07-18

    原文格式PDF

  • 申请/专利权人 2C A/S;

    申请/专利号DKPA200200080

  • 发明设计人 CASPERSEN CHRISTIAN;

    申请日2002-01-17

  • 分类号G01B11/30;

  • 国家 DK

  • 入库时间 2022-08-22 00:03:28

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