Inspection method for flowers, stems or plants, especially tulips, uses image generated by x=ray inspection device to measure plant properties

摘要

The flowers (2) are arranged one after the other and delivered to an x-ray inspection station (3, 4) in order to generate an image which is used to measure the properties of a bud and/or stem provided with leaves and/or other plant parts. An Independent claim is also included for the inspection device.