首页> 外国专利> METHOD OF FORMING A DOPED REGION IN A SEMICONDUCTOR BODY COMPRISING A STEP OF AMORPHIZATION BY IRRADIATION

METHOD OF FORMING A DOPED REGION IN A SEMICONDUCTOR BODY COMPRISING A STEP OF AMORPHIZATION BY IRRADIATION

机译:在半导体本体中形成掺杂区的方法,该方法包括通过辐照进行电离的步骤

摘要

In the method of manufacturing a semiconductor device (1) with a semiconductor body (2), a doped zone (3) is formed in the semiconductor body (2). The semiconductor body (2) has a crystalline surface region (4), which crystalline surface region (4) is at least partly amorphized so as to form an amorphous surface layer (5). The amorphization is achieved by irradiating the surface (6) with a radiation pulse (7) which is absorbed by the crystalline surface region (4). The radiation pulse (7) has a wavelength which is chosen such that the radiation is absorbed by the crystalline surface region (4), and the energy flux of the radiation pulse (7) is chosen such that the crystalline surface layer (5) is melted. The method is useful for making ultra-shallow junctions.
机译:在具有半导体本体(2)的半导体装置(1)的制造方法中,在半导体本体(2)上形成掺杂区(3)。半导体本体(2)具有晶体表面区域(4),该晶体表面区域(4)至少部分地非晶化以形成非晶表面层(5)。通过用被结晶表面区域(4)吸收的辐射脉冲(7)照射表面(6)来实现非晶化​​。选择辐射脉冲(7)的波长,使得辐射被晶体表面区域(4)吸收,并且选择辐射脉冲(7)的能量通量,使得晶体表面层(5)为融化了。该方法对于制作超浅结非常有用。

著录项

  • 公开/公告号WO03046967A3

    专利类型

  • 公开/公告日2003-10-16

    原文格式PDF

  • 申请/专利号WO2002IB04881

  • 发明设计人 STOLK PETER A.;

    申请日2002-11-20

  • 分类号H01L21/268;H01L21/265;H01L21/324;H01L21/225;H01L29/08;H01L21/336;H01L21/263;

  • 国家 WO

  • 入库时间 2022-08-21 23:52:48

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