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Deriving statistical device models from worst-case files
Deriving statistical device models from worst-case files
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机译:从最坏情况的文件中得出统计设备模型
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摘要
A set of worst-case device model files is provided for a production process used to mass-produce integrated circuits having a plurality of primitive device model types. A statistical device model for the production process is derived directly from the worst-case files.
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