首页> 外国专利> PROCEDURE MEASURING PARAMETERS OF ANTENNAS SUBMERGED IN ABSORBING MEDIUM BY METHOD OF SCALE MODELING, PROCESS OF PREPARATION OF SUBSTANCE TO MODEL ABSORBING MEDIUM AND COMPOSITION FOR PREPARATION OF SUBSTANCE TO MODEL ABSORBING MEDIUM

PROCEDURE MEASURING PARAMETERS OF ANTENNAS SUBMERGED IN ABSORBING MEDIUM BY METHOD OF SCALE MODELING, PROCESS OF PREPARATION OF SUBSTANCE TO MODEL ABSORBING MEDIUM AND COMPOSITION FOR PREPARATION OF SUBSTANCE TO MODEL ABSORBING MEDIUM

机译:尺度建模,模型吸收介质的制备过程和模型吸收介质的制备方法测量吸收介质中浸入水中的天线的参数

摘要

FIELD: radio engineering. SUBSTANCE: invention refers to technology of antenna measurements, it can be used to carry out laboratory investigations by method of scale modeling of parameters of antennas submerged in semiconducting medium. Procedure includes modeling of structure and relief of medium above and under antenna with subsequent measurement of parameters in echo-free chamber. It is proposed to prepare substance to model absorbing medium from easy-to-obtain and relatively inexpensive materials by way of their thermal treatment and following homogenization ensuring formation of gel maintaining parameters and plasticity in the course of several days. Composition for preparation of substance includes organic filling agent ( coarse flour of hard wheat with high content of gluten ), sodiumcarrying matter, binding matter ( chalk ) and distilled water. Composition does not include any toxic substances, is safe in utilization and can be stored for long time without deterioration of its properties. EFFECT: increased accuracy of measurement of parameters of antennas by method of scale modeling, expanded modeling range of parameters of absorbing media, reduced usage of materials for development of antennas placed in semiconducting media. 5 cl, 4 dwg
机译:领域:无线电工程。物质:本发明涉及天线测量技术,它可以通过对浸入半导体介质中的天线的参数进行比例建模的方法来进行实验室研究。程序包括对天线上方和下方的介质结构和浮雕进行建模,然后在无回声室内测量参数。提出了通过容易地获得并且相对便宜的材料通过对其进行热处理并且在均质化之后确保在几天的过程中形成凝胶保持参数和可塑性来制备用于对吸收介质进行建模的物质。用于制备物质的组合物包括有机填充剂(具有高面筋含量的硬质小麦粗粉),载钠物质,粘结物质(白垩)和蒸馏水。组合物不包含任何有毒物质,使用安全,可以长期保存而不会降低其性能。效果:通过比例建模方法提高了天线参数的测量精度,扩大了吸收介质参数的建模范围,减少了用于开发置于半导体介质中的天线的材料的使用。 5厘升,4载重吨

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