A method and device for the offset voltage free voltage measurement and adjustment of the voltage of a reference voltage source of an integrated semiconductor circuit

摘要

The invention relates to a method and a device for measuring a voltage of an internal reference voltage source of an integrated semiconductor circuit, in particular a dram, in which process the voltage to be measured by comparison with an externally supplied reference voltage is determined. By the process according to the invention can for example the voltage independent of the offset voltage of the acting as a comparator operational amplifier (2) are measured by the fact that, before the operational amplifier a commutator (1) is provided, which is transmitted to the reference voltage (v φ int φ) and the of externally supplied to reference voltage (v φ ext φ) alternatingly the inputs of the comparator (2) is applied. A software, which, for example, a part of a test equipment is set up in the form of the control unit takes place, the for the respective switching position (a and b) of the commutator (1) and stored measured value determined from this, a mean value is formed, so that the problem of the offset voltage of the comparator (2) is avoided in the form of software.