首页> 外国专利> Method for imaging of sub-millimeter layers of a patient using a computer tomograph and beam collimation with over exposure of the patient prevented by a pre-measurement step in which normalizing reference values are determined

Method for imaging of sub-millimeter layers of a patient using a computer tomograph and beam collimation with over exposure of the patient prevented by a pre-measurement step in which normalizing reference values are determined

机译:使用计算机断层扫描仪对患者的亚毫米层进行成像的方法和通过准直步骤确定准直参考值的步骤避免了患者的过度曝光的光束准直

摘要

Method uses a CT device with a detector comprising at least two rows (2) of adjoining detector elements, an X-ray source (4) and a shutter (6) for adjustment of the layer resolution thickness and has the following steps: adjustment of shutter and focal spot of the radiation source so that each row of the detector detects a sub-millimeter layer; measurement of the radiation dose incident on the detectors for a multiplicity of projections with no object present for each row; and normalizing of actual measurement values using reference values determined in the previous step. The invention also relates to a corresponding computer tomograph for implementation of the inventive method.
机译:该方法使用具有探测器的CT设备,该探测器包括至少两行(2)相邻的探测器元件,X射线源(4)和用于调节层分辨率厚度的快门(6),并具有以下步骤:辐射源的快门和焦点,以便探测器的每一行都能探测到亚毫米层;对于每行无物体的多个投影,测量入射在探测器上的辐射剂量;并使用上一步中确定的参考值对实际测量值进行归一化。本发明还涉及用于实现本发明的方法的相应的计算机断层造影仪。

著录项

  • 公开/公告号DE10141345A1

    专利类型

  • 公开/公告日2003-03-13

    原文格式PDF

  • 申请/专利权人 SIEMENS AG;

    申请/专利号DE2001141345

  • 发明设计人 SEMBRITZKI OTTO;

    申请日2001-08-23

  • 分类号G01N23/04;G03B42/04;A61B6/00;

  • 国家 DE

  • 入库时间 2022-08-21 23:42:43

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