首页> 外国专利> Measurement of the spatial coordinates of object points for determination of the 3-D coordinates of an object surface using an adapted line pattern projection method that results in increased accuracy for short recording times

Measurement of the spatial coordinates of object points for determination of the 3-D coordinates of an object surface using an adapted line pattern projection method that results in increased accuracy for short recording times

机译:使用调整后的线条图案投影方法测量对象点的空间坐标,以确定对象表面的3D坐标,从而在较短的记录时间内提高准确性

摘要

Method for optical measurement of spatial coordinates of object points in which a coded line pattern is projected onto the surface to be measured, images of the line pattern on the object surface are recorded with a camera and from the images the surface contour of the object is determined. An evaluation method is used to generate depth data from the coded light sets that has much higher resolution than the originating coded light set data. A normalized strip image of the line pattern is created using the shortest grating period, and the resulting strip images is divided into constantly rising or constantly falling half waves using the other line patterns. The intensity values of the half waves are used to create fine-stepped sub-divisions to calculate depth data. No additional light pattern is required to produce the depth data.
机译:光学测量物体点的空间坐标的方法,在该方法中,将编码的线条图案投影到要测量的表面上,用照相机记录在物体表面上的线条图案的图像,并从图像中获取物体的表面轮廓决心。一种评估方法用于从编码光集中生成深度数据,该深度数据具有比原始编码光集数据高得多的分辨率。使用最短的光栅周期创建线条图案的归一化带状图像,然后使用其他线条图案将所得的带状图像分为恒定上升或恒定下降的半波。半波的强度值用于创建细分的细分,以计算深度数据。不需要其他光图案即可产生深度数据。

著录项

  • 公开/公告号DE10155834A1

    专利类型

  • 公开/公告日2003-05-28

    原文格式PDF

  • 申请/专利权人 MAEHNER BERNWARD;

    申请/专利号DE2001155834

  • 发明设计人 MAEHNER BERNWARD;

    申请日2001-11-14

  • 分类号G01B11/25;G01B11/30;

  • 国家 DE

  • 入库时间 2022-08-21 23:42:31

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