首页> 外国专利> X-ray apparatus for determining the distribution of density and atomic number in an examination object is based on a conventional CT device with an additional two-part filter placed between the source and object

X-ray apparatus for determining the distribution of density and atomic number in an examination object is based on a conventional CT device with an additional two-part filter placed between the source and object

机译:用于确定检查对象中密度和原子序数分布的X射线设备基于常规CT装置,在源和对象之间放置一个附加的两部分滤光片

摘要

X-ray apparatus has a source (1) for emission of X- ray radiation (13), a detector for receipt of said radiation and conversion into electrical signals for further processing and a signal-processing unit (7, 8) for processing the signals. A two-part filter (9) is placed in the beam path between source and object and servers to split the beam into two, intensity dependent, beam paths.
机译:X射线设备具有用于发射X射线辐射(13)的源(1),用于接收所述辐射并将其转换成电信号以进行进一步处理的检测器以及用于处理X射线辐射的信号处理单元(7、8)。信号。在源与对象和服务器之间的光路中放置了一个两部分式滤镜(9),以将光波分为两个强度相关的光路。

著录项

  • 公开/公告号DE10160613A1

    专利类型

  • 公开/公告日2003-06-26

    原文格式PDF

  • 申请/专利权人 SIEMENS AG;

    申请/专利号DE2001160613

  • 发明设计人 HEISMANN BJOERN;HAAR THOMAS VON DER;

    申请日2001-12-11

  • 分类号G01N23/02;H05G1/02;G21K1/00;A61B6/03;

  • 国家 DE

  • 入库时间 2022-08-21 23:42:23

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