首页> 外国专利> Flat trench insulation production during manufacture of an integrated deep trench DRAM switching element comprises preparing an etch stop layer on a substrate, structuring, and further processing

Flat trench insulation production during manufacture of an integrated deep trench DRAM switching element comprises preparing an etch stop layer on a substrate, structuring, and further processing

机译:在制造集成深沟槽DRAM开关元件期间进行平坦沟槽绝缘生产包括在基板上制备蚀刻停止层,结构化和进一步处理

摘要

Flat trench insulation production involves etching a deep trench in a substrate, forming a capacitor and a strip in the deep trench, depositing an intermediate layer; depositing hard mask material over intermediate layer; structuring hard mask material layer to prepare openings for flat trenches, etching processes, removing the hard mask layer; and filling the trenches with a dielectric layer. Production of a flat trench insulation during the manufacture of an integrated deep trench DRAM switching element comprises: (a) preparing an etch stop layer on a substrate (10) and structuring; (b) etching a deep trench in the substrate not covered by the etch stop layer; (c) forming a capacitor (54) and a strip in the deep trench; (d) depositing an intermediate layer over the etch stop layer and strip; (e) depositing a hard mask material over the intermediate layer; (f) structuring the hard mask material layer to prepare openings for flat trenches; (g) back etching the intermediate layer and the etch stop layer; (h) etching the substrate and the deep trench; (g) removing the hard mask layer; and (i) filling the trenches with a dielectric layer. Preferred Features: The etch stop layer is made from silicon nitride with a thickness of 100-200 nm. The capacitor is formed by filling the trench with a silicon layer, removing the silicon layer up to the upper surface of the substrate, and depositing a polysilicon layer in the recess. The hard mask layer is made from borosilicate glass and borophosphate glass.
机译:平坦沟槽绝缘的生产包括在基板中蚀刻深沟槽,在深沟槽中形成电容器和条带,沉积中间层;在中间层上沉积硬掩模材料;结构化硬掩模材料层以准备用于平坦沟槽的开口,蚀刻工艺,去除硬掩模层;并用介电层填充沟槽。在集成的深沟槽DRAM开关元件的制造过程中,平坦沟槽绝缘的制造包括:(a)在衬底(10)上制备蚀刻停止层并进行结构化; (b)在未被蚀刻停止层覆盖的基板上蚀刻深沟槽; (c)在深槽中形成电容器(54)和条带; (d)在蚀刻停止层和条带上沉积中间层; (e)在中间层上沉积硬掩模材料; (f)构造硬掩模材料层以准备用于平坦沟槽的开口; (g)背面蚀刻中间层和蚀刻停止层; (h)蚀刻衬底和深沟槽; (g)去除硬掩模层; (i)用介电层填充沟槽。优选特征:蚀刻停止层由厚度为100-200nm的氮化硅制成。通过用硅层填充沟槽,去除硅层直至基板的上表面,并在凹部中沉积多晶硅层来形成电容器。硬掩模层由硼硅酸盐玻璃和硼磷酸盐玻璃制成。

著录项

  • 公开/公告号DE10161298A1

    专利类型

  • 公开/公告日2003-07-03

    原文格式PDF

  • 申请/专利权人 PROMOS TECHNOLOGIES INC.;

    申请/专利号DE2001161298

  • 发明设计人 LEE BRIAN S.;

    申请日2001-12-13

  • 分类号H01L21/8242;

  • 国家 DE

  • 入库时间 2022-08-21 23:42:25

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