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Memory cell with trench transistor has pn junctions defining channel region abutting walls of trench within curved area at base of trench

机译:具有沟槽晶体管的存储器单元具有pn结,该pn结在沟槽的底部的弯曲区域内限定邻接沟槽壁的沟道区域。

摘要

The memory cell has a gate electrode (4) contained in trench between a source region (2) and a drain region (3), with separation of the gate electrode from the semiconductor material by a dielectric layer acting as a memory medium. The pn junctions (14) defining the channel region (5) abut the walls of the trench within a curved lower area at the base (7) of the trench.
机译:该存储单元具有包含在源极区(2)和漏极区(3)之间的沟槽中的栅电极(4),并且栅电极通过用作存储介质的介电层与半导体材料分离。限定沟道区(5)的pn结(14)在沟槽的底部(7)的弯曲下部区域内邻接沟槽的壁。

著录项

  • 公开/公告号DE10162261A1

    专利类型

  • 公开/公告日2003-07-10

    原文格式PDF

  • 申请/专利权人 INFINEON TECHNOLOGIES AG;

    申请/专利号DE2001162261

  • 发明设计人 WILLER JOSEF;LAU FRANK;TAKACS DEZSOE;

    申请日2001-12-18

  • 分类号H01L27/115;

  • 国家 DE

  • 入库时间 2022-08-21 23:42:23

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