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Time of flight mass spectrometer with orthogonal ion infeed has reflector turned by defined angle about normal to x and y directions, detector turned through twice this angle, shifted into beam
Time of flight mass spectrometer with orthogonal ion infeed has reflector turned by defined angle about normal to x and y directions, detector turned through twice this angle, shifted into beam
The device has an orthogonal ion infeed, whereby a finer ion beam is fired into a pulser in the x direction and is pulsed out with acceleration towards the reflector, where it is deflected towards a detector. The reflector is not parallel to the pulser but rotated by a defined angle about a normal to the x and y directions and the detector is rotated through twice this angle and shifted into the reflected beam.
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