Automatic scattered light inspection of optical lenses and crystal to detect internal defects, whereby an inspection and evaluation component is arranged at an angle to an incident test beam that passes through the test piece

摘要

Method for scattered light inspection of transparent test pieces in which a test light beam (2) is directed through the test piece from an inlet surface (5) to an outlet surface (7). Light scattered from an inspection area (9) that coincides with the test beam direction is detected by an inspection and evaluation component (8) that is arranged at angle to the incident test beam. An Independent claim is included for an inspection device.