Under no half conductor system for investigation of an integrated a and one-half the conductor examination method using the half conductor examination system

摘要

A device (50) to be examined is on one side of a base plate (30) mounted. On the other surface of the base plate (30) is an auxiliary examination in front of the direction (200) for adjusting the timing of the of a half conductor examination in front of the direction (1) is attached to the writing signals transmitted. The input / output - terminal pins (e / a - terminal pins) (201) of the auxiliary examination in front of the direction (200) are connected by means of through holes (33) in the base plate (30) uniquely with the corresponding e / a - terminal pins (51) of the examined device (50) connected. Thus, the half conductor examination method, the delay difference between several of the half conductor examination in front of the direction (1) output signals can be easily suppress.