首页> 外国专利> Horizontal differential induction probe for defect analysis on pipes by stray flux technique has shape of parallelogram with angle in same direction as overrun angle of test head over defect

Horizontal differential induction probe for defect analysis on pipes by stray flux technique has shape of parallelogram with angle in same direction as overrun angle of test head over defect

机译:用于通过杂散通量技术分析管道缺陷的水平差分感应探头具有平行四边形的形状,其角度与测试头在缺陷上方的超限角相同

摘要

The induction probe has the shape of a parallelogram where the angle (5) of the parallelogram is in the same direction as the angle at which the test head passes over the defect. Individual probes (1-4) are arranged in the form of printed coils on a circuit board. Each circuit board has two parallel rows of printed probes with probes in one row offset relative to those in the other row.
机译:感应探针具有平行四边形的形状,其中平行四边形的角度(5)与测试头经过缺陷的角度相同。各个探针(1-4)以印刷线圈的形式布置在电路板上。每个电路板都有两排平行的打印探针,探针的一行相对于另一行偏移。

著录项

  • 公开/公告号DE20303868U1

    专利类型

  • 公开/公告日2003-09-18

    原文格式PDF

  • 申请/专利权人 ZIMMERMANN JAN;

    申请/专利号DE2003203868U

  • 发明设计人

    申请日2003-03-04

  • 分类号G01M19/00;

  • 国家 DE

  • 入库时间 2022-08-21 23:40:55

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