Test device of electronic connection, has information device to indicate error with logic gate for comparing value of predicted bit with effective value of next bit of sequence of output bits

摘要

The test device has a first signal generator (3) that supplies a sequence of input bits to a first extremity (E) of the electronic connection (1). An error detection device (6) receives a sequence of output bits from a second extremity (S) of the connection, in response to the sequence of input bits. A second signal generator (10) similar to the first signal generator recreates the sequence of input bits and predicts the value of the next bit when the second extremity of the connection supplies a bit of the output sequence. An information device (14) indicates the presence of an error with a logic gate (13) for comparing the value of the predicted bit with the effective value of the next bit of the sequence of output bits.