首页> 外国专利> Bolometric detector production comprises use of sacrificial auxiliary layer to connect reading circuit to bolometric substrate of polycrystalline silicon to detect infrared radiation

Bolometric detector production comprises use of sacrificial auxiliary layer to connect reading circuit to bolometric substrate of polycrystalline silicon to detect infrared radiation

机译:量测检测器的生产包括使用牺牲辅助层将读取电路连接到多晶硅的量测衬底以检测红外辐射

摘要

The production of a bolometric detector comprises, from a reading circuit produced on a silicon substrate (1): (a) forming a first auxiliary sacrificial layer (3) on the silicon substrate, destined to be removed after the realization of the detector in order to thermally decouple the reading circuit of the detection module; and (b) forming on this sacrificial layer a layer of bolometric material of amorphous silicon (5) and electrodes to carry the necessary electric signals for the operation of the bolometer and to send the signal resulting from the detection of infrared radiation by the bolometer to the reading circuit. The layer of bolometric material is subjected to a laser radiation to transform it into a polycrystalline silicon. An Independent claim is also included for a bolometric detector using polycrystalline silicon as the bolometric material.
机译:辐射热检测器的制造包括从在硅衬底(1)上产生的读取电路中:(a)在硅衬底上形成第一辅助牺牲层(3),该传感器将在实现检测器后按顺序除去使检测模块的读取电路热解耦; (b)在该牺牲层上形成一层非晶硅的辐射热材料(5)和电极,以承载运行辐射热计所需的电信号,并将辐射热计检测到的红外辐射产生的信号发送至阅读电路。辐射热材料层经受激光辐射以将其转变为多晶硅。对于使用多晶硅作为辐射热测量材料的辐射热检测器,也包括独立权利要求。

著录项

  • 公开/公告号FR2827707A1

    专利类型

  • 公开/公告日2003-01-24

    原文格式PDF

  • 申请/专利号FR20010009715

  • 发明设计人 LARRE ANNICK;

    申请日2001-07-20

  • 分类号H01L27/146;G01J5/20;H04N5/33;

  • 国家 FR

  • 入库时间 2022-08-21 23:38:00

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