Defect detecting method in infrared thermal imaging system.

摘要

In a defect detecting method in an infrared thermal imaging system, digital video signals representing a uniform high temperature image and a uniform low temperature image are received, S400,. The gain and offset of each pixel are calculated using the high temperature image and the low temperature image, S405, the average of the gains as a first average gain and the average of the offsets are calculated, S410. It is determined whether each pixel is a defect using the first average gain and the average offset by comparison with gain and offset ranges. The method is effective for detecting so-called 'soft defects' that occur in imaging systems over time.