首页> 外国专利> FIXTURE FOR INSPECTING ECCENTRICITY OF PANORAMA IMAGE BLOCK AND ECCENTRICITY INSPECTION METHOD

FIXTURE FOR INSPECTING ECCENTRICITY OF PANORAMA IMAGE BLOCK AND ECCENTRICITY INSPECTION METHOD

机译:全景图像块偏心检查治具及偏心检查方法

摘要

PROBLEM TO BE SOLVED: To provide a fixture for inspecting eccentricity of a panorama image block and an eccentricity inspection method wherein imperfect products can be selected comparatively easily and effectively at a low cost.;SOLUTION: The fixture for inspecting eccentricity of a panorama image block is provided with a cylindrical part 4 wherein an optical axis 2 of a normal panorama image block 1 overlaps with a center axis 3 of the cylindrical part 4 by attaching it. Length of a peripheral wall 5 constituting the cylindrical part 4 is so set that a prescribed angle area θ1 out of an angle θ0 of filed of the normal panorama image block 1 is covered with the peripheral wall 5 equally around the whole circumference. As a result, the fixture for inspecting eccentricity of an image block and the eccentricity inspection method using the fixture are provided.;COPYRIGHT: (C)2004,JPO
机译:解决的问题:提供一种用于检查全景图像块的偏心的夹具和一种偏心率检查方法,其中可以相对容易且有效地以低成本选择不完美的产品;解决方案:用于检查全景图像块的偏心的夹具。镜筒1具有圆筒形部分4,其中正常全景图像块1的光轴2通过附接而与圆筒形部分4的中心轴3重叠。设置构成圆筒形部分4的周壁5的长度,使得正常全景图像块1的入射角θ0中的规定角度区域θ1被周壁5围绕整个圆周均等地覆盖。 。结果,提供了用于检查图像块的偏心率的夹具以及使用该夹具的偏心率检查方法。;版权所有:(C)2004,JPO

著录项

  • 公开/公告号JP2004012289A

    专利类型

  • 公开/公告日2004-01-15

    原文格式PDF

  • 申请/专利权人 TATEYAMA R & D:KK;

    申请/专利号JP20020165855

  • 发明设计人 DOI SADA;HAYASHI KAZUNORI;

    申请日2002-06-06

  • 分类号G01M11/00;

  • 国家 JP

  • 入库时间 2022-08-21 23:34:18

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