首页> 外国专利> INTEGRATED CIRCUIT FOR INCORPORATED UNIT, INCORPORATED UNIT AND INCORPORATED UNIT CONTROL SYSTEM

INTEGRATED CIRCUIT FOR INCORPORATED UNIT, INCORPORATED UNIT AND INCORPORATED UNIT CONTROL SYSTEM

机译:合并单元,合并单元和合并单元控制系统的集成电路

摘要

PPROBLEM TO BE SOLVED: To improve quality of an incorporated unit and to easily test and monitor the incorporated unit. PSOLUTION: An IC 101 for the incorporated unit is incorporated in the incorporated unit and tests an operation of the incorporated unit. The IC 101 is provided with a communication part 102 receiving test item data from an external unit and transmitting a test result to the outer unit, a test part 105 testing the incorporated unit based on received test item data and transferring the test result to the communication part 102, a test result collecting part 108 collecting the test result and a test result storage part 109 storing the test result. PCOPYRIGHT: (C)2004,JPO
机译:

要解决的问题:提高内置单元的质量并轻松测试和监视内置单元。

解决方案:用于内置单元的IC 101内置在内置单元中,并测试内置单元的操作。 IC 101设置有通信部分102,该通信部分102从外部单元接收测试项目数据并将测试结果发送到外部单元,测试部分105基于接收到的测试项目数据来测试内置单元,并将测试结果传送到通信中。部件102,测试结果收集部件108和测试结果存储部件109存储测试结果。

版权:(C)2004,日本特许厅

著录项

  • 公开/公告号JP2004046299A

    专利类型

  • 公开/公告日2004-02-12

    原文格式PDF

  • 申请/专利权人 CATS KK;

    申请/专利号JP20020199190

  • 申请日2002-07-08

  • 分类号G06F11/22;G01R31/28;G06F11/30;

  • 国家 JP

  • 入库时间 2022-08-21 23:33:13

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