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LATTICE CONSTANT DETERMINATION METHOD AND MATERIAL EVALUATION METHOD USING THE SAME

机译:相同的晶格常数测定方法和材料评估方法

摘要

PPROBLEM TO BE SOLVED: To provide a method for rapidly and easily determining the lattice constant of any material such as a polycrystalline material, and a method for rapidly evaluating the stress and strain of the material. PSOLUTION: By varying the lattice constant of a standard specimen in a specified range, the HOLZ line pattern of the standard specimen is provided by a calculation using an expression (y = f (x, a) = (a) x + (a)), the data is accumulated, and a data library is constructed. On the other hand, the evaluated specimen is radiated/scanned with a convergent electron beam, the developed HOLZ line pattern is collated with the pattern data library to select the mostly matching HOLZ line pattern. The lattice constant of the measured specimen is determined from the lattice constant data of the data library having the HOLZ line pattern. Also, the distributed state of stress and strain in the specimen can be two-dimensionally mapped from the determined lattice constant. PCOPYRIGHT: (C)2004,JPO
机译:<要解决的问题:提供一种用于快速而容易地确定诸如多晶材料的任何材料的晶格常数的方法,以及一种用于快速评估材料的应力和应变的方法。

解决方案:通过在指定范围内改变标准样品的晶格常数,可通过使用表达式(y = f(x,a)=(a)x + (a)),累积数据,并构建数据库。另一方面,用会聚的电子束辐射/扫描被评估的样本,将展开的HOLZ线条图案与图案数据库进行比对,以选择最匹配的HOLZ线条图案。根据具有HOLZ线图案的数据库的晶格常数数据来确定被测样品的晶格常数。同样,可以根据确定的晶格常数二维映射试样中应力和应变的分布状态。

版权:(C)2004,日本特许厅

著录项

  • 公开/公告号JP2004093281A

    专利类型

  • 公开/公告日2004-03-25

    原文格式PDF

  • 申请/专利权人 TOSHIBA CORP;

    申请/专利号JP20020253647

  • 发明设计人 TAKENO SHIRO;

    申请日2002-08-30

  • 分类号G01N23/207;G01B15/00;G01B15/06;G01L1/00;H01L21/66;

  • 国家 JP

  • 入库时间 2022-08-21 23:32:39

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