首页> 外国专利> TAP DENSITY MEASUREMENT VESSEL, TAP DENSITY MEASUREMENT TOOL AND TAP DENSITY MEASUREMENT METHOD

TAP DENSITY MEASUREMENT VESSEL, TAP DENSITY MEASUREMENT TOOL AND TAP DENSITY MEASUREMENT METHOD

机译:TAP密度测量容器,TAP密度测量工具和TAP密度测量方法

摘要

PROBLEM TO BE SOLVED: To provide a tap density measurement vessel, a tap density measurement tool and a tap density measurement method for repeatably and accurately measuring a tap density.;SOLUTION: The measurement vessel is provided with a first vessel 2 and a second vessel 3 disposed on the first vessel 2 and communicating with the first vessel 2. The second vessel 3 can be detached from the first vessel 2. The measurement vessel includes a sample. After the sample is attached to a tapping apparatus and tapped, the second vessel 3 slides on an upper end face of the first vessel 2, a level of the sample is limited by a lower end face of the second vessel 3, mass of the sample remaining in the first vessel 2 is measured and divided by sample storing volume of the first vessel 2 and the tap density of the sample is measured.;COPYRIGHT: (C)2004,JPO
机译:解决的问题:为了提供抽头密度测量容器,抽头密度测量工具和抽头密度测量方法,以重复且准确地测量抽头密度。解决方案:测量容器具有第一容器2和第二容器。图3中的第一容器2设置在第一容器2上并且与第一容器2连通。第二容器3可以与第一容器2分离。测量容器包括样本。在将样品附着到攻丝设备并敲击之后,第二容器3在第一容器2的上端面上滑动,样品的水平受到第二容器3的下端面的限制,样品的质量测量保留在第一容器2中的残留量并除以第一容器2的样品存储量,并测量样品的振实密度。版权所有:(C)2004,JPO

著录项

  • 公开/公告号JP2004117218A

    专利类型

  • 公开/公告日2004-04-15

    原文格式PDF

  • 申请/专利权人 SEIKO EPSON CORP;

    申请/专利号JP20020281861

  • 发明设计人 WATANABE ATSUSHI;

    申请日2002-09-26

  • 分类号G01N9/36;

  • 国家 JP

  • 入库时间 2022-08-21 23:32:13

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