首页> 外国专利> FLUORESCENCE MICROSCOPE, MEASURING METHOD OF FLUORESCENT LIFETIME, AND MEASURING PROGRAM OF FLUORESCENT LIFETIME

FLUORESCENCE MICROSCOPE, MEASURING METHOD OF FLUORESCENT LIFETIME, AND MEASURING PROGRAM OF FLUORESCENT LIFETIME

机译:荧光显微镜,荧光寿命的测量方法以及荧光寿命的测量程序

摘要

PROBLEM TO BE SOLVED: To provide a fluorescence microscope for measuring a fluorescent lifetime by an inexpensive constitution.;SOLUTION: A semiconductor laser 1 irradiates laser light which is excitation light toward a sample 6 which is an observation object. A duty ratio adjuster 12 varies the ratio between the ON time and the OFF time of the semiconductor laser 1 by a command from a computer 10. A CCD 9 has a function for accumulating as long as a fixed time fluorescence radiated from the sample 6 and integrating the fluorescence. A plurality of integrated fluorescences are acquired from the CCD 9 by changing the ratio between the ON time and the OFF time of the semiconductor laser 1. Then, the computer 10 calculates the fluorescent lifetime by fitting a target function including the fluorescent lifetime as a parameter to a change curve of the integrated fluorescence relative to the ratio between the ON time and the OFF time of the semiconductor laser 11.;COPYRIGHT: (C)2004,JPO&NCIPI
机译:解决的问题:提供一种以廉价的构造来测量荧光寿命的荧光显微镜。解决方案:半导体激光器1向作为观察对象的样品6照射作为激发光的激光。占空比调节器12通过计算机10的命令来改变半导体激光器1的接通时间和断开时间之间的比率。CCD9具有用于累积从样品6和样品6发出的固定时间的荧光的时间长的功能。积分荧光。通过改变半导体激光器1的开启时间和关闭时间之间的比率,从CCD 9获取多个积分荧光。然后,计算机10通过拟合包括荧光寿命作为参数的目标函数来计算荧光寿命。相对于半导体激光器11的开启时间与关闭时间之比的积分荧光的变化曲线;版权所有:(C)2004,JPO&NCIPI

著录项

  • 公开/公告号JP2004212203A

    专利类型

  • 公开/公告日2004-07-29

    原文格式PDF

  • 申请/专利权人 OLYMPUS CORP;

    申请/专利号JP20020381793

  • 发明设计人 ENDO TOMIO;

    申请日2002-12-27

  • 分类号G01N21/64;

  • 国家 JP

  • 入库时间 2022-08-21 23:31:17

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