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SUBSTRATE FOR ANALYZING POLYMER, ARRAY FOR ANALYZING POLYMER AND POLYMER ANALYZING METHOD

机译:高分子分析用基质,高分子分析用阵列及高分子分析方法

摘要

PROBLEM TO BE SOLVED: To make performable an analysis accurately with high sensitivity by regulating the content of impurities and to make performable an analysis by accurately recognizing an analyzing target position.;SOLUTION: In a polymer analyzing method of analyzing a polymer to be analyzed formed on a substrate using laser aberration, the content of a labelled element in a substrate material is set to be ≤ 1 ppm and position information is formed on a polymer part and/or a substrate.;COPYRIGHT: (C)2004,JPO&NCIPI
机译:解决的问题:通过调节杂质的含量,以高灵敏度准确地进行分析,并通过准确地识别分析目标位置来进行分析。;解决方案:一种在聚合物分析方法中分析所形成的聚合物的方法在使用激光像差的基板上,将基板材料中的标记元素的含量设定为≤。 1 ppm,并且在聚合物部件和/或基材上形成位置信息。;版权所有:(C)2004,JPO&NCIPI

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