首页> 外国专利> RELATIVE INCLINED AMOUNT MEASURING METHOD OF ROUNDNESS FINDER, MEASUREMENT VALUE CORRECTING METHOD, INSPECTION TOOL,AND MANUFACTURING METHOD THEREOF

RELATIVE INCLINED AMOUNT MEASURING METHOD OF ROUNDNESS FINDER, MEASUREMENT VALUE CORRECTING METHOD, INSPECTION TOOL,AND MANUFACTURING METHOD THEREOF

机译:测圆仪的相对倾斜量测量方法,测量值校正方法,检查工具及其制造方法

摘要

PROBLEM TO BE SOLVED: To provide a relative inclined amount measuring method for a roundness measurement device, along with a measurement value correcting method, an inspection tool, and a manufacturing method thereof, capable of acquiring reliable measurement result without increasing laborious processes and at a low cost.;SOLUTION: Related to first and second gauge blocks 41 and 42, in which the dimension between first and second reference surfaces, facing each other, is worked to a specified value, an inspection tool 4 fixed on both end faces of a cylinder 40 with their first reference surfaces 411 and 421 almost parallel to an inspection tool axial line S3 of the cylinder 40 is placed on a core-levelling table 21. Based on the location measurements of the first reference surfaces 411 and 421, a first relative inclined amount between a detector guide direction axial line S2 and an inspection tool axial line S3 is acquired. After the core-levelling table 21 is rotated by 180°, a second relative inclination amount between the detector guide direction axial line S2 and the inspection tool axial line S3 is acquired, based on localizing of second reference surfaces 412 and 422. A column relative inclined amount Q, between a table rotating shaft S1 and the detector guide direction axial line S2, is acquired based on the first and second relative inclined amounts.;COPYRIGHT: (C)2004,JPO
机译:解决的问题:提供一种用于圆度测量装置的相对倾斜量测量方法,以及一种测量值校正方法,检查工具及其制造方法,其能够获得可靠的测量结果而无需增加费力的过程并且在不增加成本的情况下。解决方案:与第一和第二量规块41和42有关,其中将第一和第二参考表面之间相对的尺寸加工到指定值,在该工具的两个端面上固定一个检查工具4。将其第一参考表面411和421几乎平行于圆柱体40的检查工具轴线S3的圆柱体40放置在堆芯调平台21上。基于第一参考面411和421的位置测量,获取检测器引导方向轴线S2与检查工具轴线S3之间的倾斜量。在将核心调平台21旋转180°之后,基于第二基准面412和422的定位,获取检测器引导方向轴线S2和检查工具轴线S3之间的第二相对倾斜量。基于第一和第二相对倾斜量,获取工作台旋转轴S1和检测器引导方向轴线S2之间的倾斜量Q。COPYRIGHT:(C)2004,JPO

著录项

  • 公开/公告号JP2004163358A

    专利类型

  • 公开/公告日2004-06-10

    原文格式PDF

  • 申请/专利权人 MITSUTOYO CORP;

    申请/专利号JP20020331968

  • 发明设计人 TSURUTA ATSUSHI;OMORI YOSHIYUKI;

    申请日2002-11-15

  • 分类号G01B21/30;

  • 国家 JP

  • 入库时间 2022-08-21 23:29:01

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