首页> 外国专利> RELIABILITY TEST METHOD OF PROTECTION CIRCUIT OF ELECTRONIC BALLAST FOR FLUORESCENT LAMP, AND PROTECTIVE OPERATION CONFIRMATION METHOD IN OUTGOING INSPECTION OF ELECTRONIC BALLAST FOR FLUORESCENT LAMP

RELIABILITY TEST METHOD OF PROTECTION CIRCUIT OF ELECTRONIC BALLAST FOR FLUORESCENT LAMP, AND PROTECTIVE OPERATION CONFIRMATION METHOD IN OUTGOING INSPECTION OF ELECTRONIC BALLAST FOR FLUORESCENT LAMP

机译:荧光灯电子镇流器保护电路的可靠性测试方法及荧光灯电子镇流器出库检验的保护操作确认方法

摘要

PPROBLEM TO BE SOLVED: To provide a reliability test method of a protection circuit of an electronic ballast for a fluorescent lamp capable of executing a large number of tests in a short period while simulating an end-of-life transient phenomenon of the fluorescent lamp. PSOLUTION: This reliability test method of a protection circuit of an electronic ballast for a fluorescent lamp is characterized by that, in the electronic ballast of the fluorescent lamp, an impedance-variable element is connected to the load side of the electronic ballast; and a history passed by the actual fluorescent lamp as the transient phenomenon at the end of life is recreated by the impedance-variable element to confirm the protective operation of the electronic ballast. PCOPYRIGHT: (C)2004,JPO&NCIPI
机译:

要解决的问题:提供一种用于荧光灯的电子镇流器保护电路的可靠性测试方法,该方法能够在短时间内执行大量测试,同时模拟其寿命终止瞬态现象。日光灯。

解决方案:这种用于荧光灯电子镇流器保护电路的可靠性测试方法的特征在于,在荧光灯的电子镇流器中,阻抗可变元件连接到电子镇流器的负载侧。 ;阻抗可变元件重现了实际荧光灯在寿命尽头时出现的瞬态现象,以确认电子镇流器的保护工作。

版权:(C)2004,日本特许厅和日本国家唱片公司

著录项

  • 公开/公告号JP2004185887A

    专利类型

  • 公开/公告日2004-07-02

    原文格式PDF

  • 申请/专利权人 OSRAM-MELCO LTD;

    申请/专利号JP20020349448

  • 发明设计人 KONDO KAZUYOSHI;OSAWA TAKASHI;

    申请日2002-12-02

  • 分类号H05B37/02;

  • 国家 JP

  • 入库时间 2022-08-21 23:28:54

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