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It is deep double refraction measurement at ultraviolet wave length

机译:紫外线波长下的深双折射测定

摘要

Topic The optical element, especially, it is deep ultraviolet (DUV), offer the device and method in order to measure the double refraction quality of the optical kind of element which is used for wave length accurately.SolutionsThe device includes, the sample (136) two photoelastic modulators which are arranged on both sides (PEM) (126 and 128). Each PEM in order to modulate the polarity of the light beam which passes the sample, is operation possible. As for the device, in addition, the polarizer which is connected to on the one hand PEM (124) with, the analyzer which is connected to other PEM (130) with, two PEM, after passing the polarizer and the analyzer, the detector in order to measure the strength of light (132) with it includes. You can obtain the technology in order to measure double refraction quality over wide scope. For example, execution example of the double wave length illuminant is offered in order to measure the double refraction of relatively high level. In addition, from many techniques in order to decide double refraction quality on the basis of the appraisal value or estimator of the double refraction which is inspected because of the optical element which is given as the sample, technology in order to select the accuracy and effective technique is offered. Selective figure Figure 3
机译:<主题>光学元件,尤其是深紫外线(DUV),提供了一种装置和方法,以便准确地测量用于波长的光学种类的光学元件的双折射质量。解决方案该装置包括样品(136)两个光弹性调制器,其布置在两侧(PEM)(126和128)。为了调制通过样品的光束的极性,每个PEM都是可行的。至于该装置,另外,在通过偏振器和检偏器之后,一方面将偏光器与PEM(124)连接,将检偏器与另一个PEM(130)与两个PEM连接。为了测量包括的光(132)的强度。您可以获取该技术,以便在较宽的范围内测量双折射质量。例如,提供双波长发光体的执行示例以测量相对较高水平的双折射。另外,为了根据作为样品的光学元件而被检查的双折射的评价值或估计量,为了决定双折射的质量,从许多技术中选择技术的准确性和有效性。提供了一种技术。<选择图>图3

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