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Optimized exclusive binary correlation measurement method, optimized exclusive binary measurement device, and program for executing the method

机译:优化的专用二进制相关测量方法,优化的专用二进制测量设备以及用于执行该方法的程序

摘要

PROBLEM TO BE SOLVED: To execute an exclusive binarization correlation measurement in the method and program executing the method for optimized exclusive binarization correlation measurement, by setting an allowable error span for judging whether the magnitudes of a reference signal and a measured signal are equal or not, at an optimum value. SOLUTION: Pixel values of each image of the reference signal and the measured signal are compared and exclusively binarized according to whether or not the values of the reference signal and the measured signal are equal. For the basis of judging whether or not the values of the reference signal and the measured signal are equal, the allowable error span is determined. According to the relation among the reference signal, the measured signal and the allowable error span, the exclusive binarization is applied to the measured signal, and the correlation of the reference signal and the measured signal is measured.
机译:解决的问题:通过设置允许误差范围来判断参考信号和测量信号的幅度是否相等,以在用于优化排他二值化相关性测量的方法中执行排他二值化相关性测量并执行该方法的程序。 ,处于最佳值。解决方案:将参考信号和测量信号的每个图像的像素值进行比较,并根据参考信号和测量信号的值是否相等进行二值化。为了判断参考信号和测量信号的值是否相等,确定容许误差范围。根据参考信号,测量信号和容许误差范围之间的关系,将异二值化应用于测量信号,并且测量参考信号和测量信号的相关性。

著录项

  • 公开/公告号JP3554822B2

    专利类型

  • 公开/公告日2004-08-18

    原文格式PDF

  • 申请/专利权人 独立行政法人情報通信研究機構;

    申请/专利号JP20010143873

  • 发明设计人 大屋 真;

    申请日2001-05-14

  • 分类号G01P5/22;G01P3/80;G06F17/15;G06T7/20;H04N5/225;H04N7/18;

  • 国家 JP

  • 入库时间 2022-08-21 23:26:49

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