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High resolution etalon - grating monochromator spectroscope

机译:高分辨率标准具-光栅单色仪

摘要

High resolution etalon - lattice type spectroscope or it is the monochromator. It is very useful in band width measurement of the narrow band excimer laser to which desirable execution form gives the slit function where the ultraviolet range is very narrow, is used for integrated circuit flat printing method. The light where light from the laser comes out of the combination burning and diffuser in the diffuser and spreads irradiates the etalon. Portion of the light which comes out of the etalon, is gathered in the slit which is arranged with stripe pattern of the etalon and is led. The light which passes the slit is parallel converted, the lattice which is almost arranged with Littrow which the light which the said parallel is converted, follows to wave length and makes light disperse constitution is irradiated. Portion of the light which displays the wave length which corresponds to the etalon stripe which is selected and is dispersed, passes the 2nd slit, monitoring is done by the photodetector. When being adjusted the wave length where the etalon and the lattice are the same accurate, slit function, approximately 0.034pm (FWHM) and approximately 0.091pm (95 percent integral calculus) the way is decided as very narrow ones. The etalon and the lattice are accommodated in the container which does not have a leak to which the gas like nitrogen or helium is filled. At the time of constituting the spectroscope, wave length scan of the spectroscope is done by changing the gas pressure inside the container which is in the midst of scanning. At the time of monochromator constituting, band width of the laser beam leads portion of the laser beam in the monochromator, it is possible to measure very accurately by scanning the laser wave length which covers the range which includes monochromator slit wave length.
机译:高分辨率标准具-点阵式分光镜或单色仪。在集成电路的平面印刷方法中,在期望的执行形式赋予紫外线范围非常窄的狭缝功能的窄带受激准分子激光器的带宽测量中非常有用。来自激光的光从燃烧器和扩散器的组合发出,并扩散到扩散器中,并照射标准具。从标准具发出的光的一部分聚集在以标准具的条纹图案排列的狭缝中并被引导。通过狭缝的光被平行转换,与被平行化的光转换成的利特罗(Littrow)几乎排列成格子状,照射到波长而使光分散的结构。显示与选择并分散的标准具条纹相对应的波长的光的一部分,通过第二狭缝,由光电检测器进行监视。当调整标准具和晶格具有相同精确,狭缝函数的波长时,大约0.034pm(FWHM)和大约0.091pm(95%积分)的方式被确定为非常窄的波长。标准具和晶格被容纳在没有泄漏的容器中,氮气或氦气之类的气体被填充到该泄漏中。在构成光谱仪时,通过改变处于扫描过程中的容器内部的气压来进行光谱仪的波长扫描。在构成单色仪的情况下,通过使单色仪中的激光的激光束引出部分的带宽变宽,可以通过扫描覆盖单色仪狭缝波长的范围的激光波长来进行非常高精度的测量。

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