Hard macro test circuit, the test methods and test pattern generation method

摘要

PROBLEM TO BE SOLVED: To provide circuit constitution capable of testing integrally both signal body inspection for a hard macro circuit and inspection for a peripheral circuit in the hard macro, as scan path inspection for a circuit including the hard macro.;SOLUTION: A scan pattern for the macro wherein logics in combinational circuits 21, 22 are taken into account is set in a scan flip-flop SCAN-FF 30 on the input side from a scan-in terminal SIN, an output of the SCAN-FF 30 is input to the hard macro circuit 2 via the combinational circuit 21 on the input side, an operated result in the circuit 2 is taken into the SCAN-FF 30 on the output side via the combinational circuit 22 on the output side, and the output of the SCAN-FF 30 is output as a comparision signal for comparing it with an expected value preliminarily set in a scan output terminal SOT.;COPYRIGHT: (C)2001,JPO